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Domain > applied-spectroscopy.info
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Date
IP Address
2024-09-09
80.237.132.160
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ClassC
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Port 80
HTTP/1.1 200 OKDate: Mon, 09 Sep 2024 17:13:20 GMTContent-Type: text/htmlContent-Length: 5082Connection: keep-aliveServer: ApacheLast-Modified: Thu, 18 Jan 2024 13:27:20 GMTETag: 13da-60f3852b1a4adAccept-Ranges: bytes !DOCTYPE html PUBLIC -//W3C//DTD XHTML 1.0 Transitional//EN http://www.w3.org/TR/xhtml1/DTD/xhtml1-transitional.dtd>html xmlnshttp://www.w3.org/1999/xhtml dirltr xmlns:msdtuuid:C2F41010-65B3-11d1-A29F-00AA00C14882 xmlns:msourn:schemas-microsoft-com:office:office xmlns:vurn:schemas-microsoft-com:vml>!-- #BeginTemplate master.dwt -->head>meta http-equivContent-Type contenttext/html; charsetutf-8 />link RELSHORTCUT ICON HREFTranSpec.ico />!-- #BeginEditable doctitle -->title>Engineer's Office for Applied Spectroscopy - Film Thickness Gauges and Plasma Monitoring/title>meta namerobots contentALLINDEX,FOLLOW />meta namerevisit-after content30 days />meta namedescription contentWe offer gauges for the photodiode array spectroscopy, film thickness measurement and plasma emission monitoring, especially for in-line measurement tasks. />meta namekeywords contentfilm thickness measurement,film thickness gauge,film thickness gage,thickness measurement,thickness gauge,thickness gage,thin film measurement,thin film gauge,thin film gage,interference,reflectometry,white-light,white light,coating thickness,web coating,web coater,diode array,photodiode,photodiode array,spectrometer,photometer,spectroscopy,spectrometry,plasma emission,plasma control,emission,emission control,chamber,sputter,plasma,vacuum,PVD,PEVD,UV,VIS,NIR,Parylene>style typetext/css>.style3 { text-align: justify;}/style>!-- #EndEditable -->link relstylesheet typetext/css titleCSS hrefstyles/style1.css mediascreen />style typetext/css>.style1 { text-decoration: underline;}.style2 { font-size: larger; font-family: Century Gothic; color: #FEFEFE;}.auto-style1 { color: #FFFFFF;}/style>/head>body>!-- Begin Container -->div idcontainer> !-- Begin Masthead --> div idmasthead styleheight: 100px> p>strong>span classstyle2>Engineer's Office for Applied Spectroscopybr /> br /> /span>/strong>span classauto-style1>Bischof-Fischer-Str. 108br /> 73430 Aalen - Germanybr /> Fon +49 7361 97 53 28 0br /> Fax +49 7361 97 53 28 5/span>/p> /div> !-- End Masthead --> !-- Begin Page Content --> div idpage_content> !-- Begin Sidebar --> div idsidebar> ul> li>a hrefindex.html>Home/a>/li> li>a hrefimpressum.htm>About us/a>/li> li>a hreffilmthickness.htm>Film Thickness/a>/li> li>a hrefplasma.htm>Plasma Emission/a>/li> li>a hrefinstruments.htm>Gauges/a>/li> li>a hrefdatasheets.htm>Data Sheets/a>/li> li>a hrefcontact.htm>Contact/a>/li> li>a hreflegal.htm>Legal and Privacy/a>/li> /ul> /div> !-- End Sidebar --> !-- Begin Content --> div idcontent> !-- #BeginEditable content --> h3>Welcome/h3> p classstyle3>strong>Engineer's Office for Applied Spectroscopy/strong> supplies high-end measurement technology for the photodiode array spectroscopy. We specialize in film thickness measurement and plasma emission monitoring for lab use, in-line measurement and process controlling. Based on our experience of more than 25 years we offer customized solutions world-wide!/p> p classstyle3>strong>Film Thickness Measurement/strong>br /> Our TranSpec film thickness gauges use the commonly known white-light interference phenomenon for non-destructive and non-contact film thickness measurement of thin transparent layers./p> p classstyle3>strong>Plasma Emission Measurement/strong>br /> The fiber optics coupled TranSpec photodiode array spectrometer observes plasma emission inside the vacuum chamber in the entire UV-VIS-NIR spectral range, simultaneously and in real-time!br /> /p> p classstyle3>Please also visit our additional Website at a hrefhttp://www.applied-spectroscopy.com> www.applied-spectroscopy.com/a> ./p> !-- #EndEditable -->/div> !-- End Content -->/div> !-- End Page Content --> !-- Begin Footer --> div idfooter> p>a hrefindex.html>span classstyle1>Home/span>/a> | a hrefimpressum.htm>span classstyle1>About us/span>/a> | span classstyle1>a hreffilmthickness.htm>Film Thickness/a>/span> | a hrefplasma.htm>span classstyle1>Plasma Emission/span>/a> | a hrefinstruments.htm>span classstyle1>Gauges/span>/a> | span classstyle1> a hrefdatasheets.htm>Data Sheets/a>/span> | span classstyle1>a hrefcontact.htm>Contact/a>/span> | span classstyle1>a hreflegal.htm>Legal and Privacy/a>/span> br /> br /> Copyright © 2024 Engineer's Office for Applied Spectroscopy. All rights reserved.br /> Website was edited last on January 18, 2024 - Webmaster: Thomas Fuchs/p> /div> !-- End Footer -->/div>!-- End Container -->/body>!-- #EndTemplate -->/html>
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